Reflectance Meter - List of Manufacturers, Suppliers, Companies and Products | IPROS

Reflectance Meter Product List

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Near-infrared reflectance meter

Continuous measurement possible in just 3 seconds with high precision! - We will develop an original near-infrared reflectance measuring device.

We will develop and design a reflectance measurement device tailored to the specific near-infrared range according to customer needs. ◆ Wavelengths of selectable LED light sources: 750nm to 1650nm (as of July 2023) ◆ Optical system's light transmission and reception method: Unidirectional illumination - integrating sphere reception method or unidirectional transmission and reception method ◆ Measurable reflectance: Total reflectance, specular reflectance, diffuse reflectance, and retroreflectance using a beam splitter (half mirror) ◆ Designable irradiation angle and reception angle: 0° to 80° MAX relative to the normal direction Furthermore, if you wish to measure reflectance at a specific wavelength not limited to the near-infrared range, we can also manufacture a reflectance measurement device according to your requirements. ● Our self-developed measurement device features a lightweight, compact body with rechargeable capabilities ● Achieves low cost through measurements specifically focused on near-infrared wavelengths ● Capable of measuring the performance of thermal insulation products in just 3 seconds As a product version, we sell the thermal insulation characteristic measurement device [TP-01] with 4 wavelengths.

  • Non-destructive testing
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  • Reflectance Meter

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Portable near-infrared reflectance meter

Easy measurement on-site! Weighing only 208g, a portable near-infrared reflectance meter that can be directly applied to the target object.

The TP-H4N is a portable near-infrared reflectance meter that allows for on-site comparison of surface changes by measuring reflectance directly on the target object. Weighing approximately 208g, it is lightweight and compact. It can be easily transported not only to laboratories but also to factories and construction sites for quick measurements. Unlike spectrophotometers, there is no need to cut out samples and set them in measurement cells; it can directly measure the reflectance of painted surfaces, coatings, and resin materials. It supports rapid decision-making on-site for evaluations of thermal insulation materials, quality control, and material comparisons. ■ Lightweight and compact design at approximately 208g ■ Can measure directly on the target object ■ Compatible with paint films, painted surfaces, coatings, and resin materials ■ No need for sample cutting or pretreatment ■ Easily check reflectance on-site ■ Widely applicable from research and development to quality control ■ Capable of measuring the performance of thermal insulation products in just 3 seconds - We will develop a near-infrared reflectance meter for your desired wavelength in the near-infrared range - ◆ Selectable LED light source wavelengths: 750nm to 1650nm ◆ Optical system light transmission and reception method: unidirectional irradiation - integrating sphere reception method or unidirectional transmission and reception method.

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  • Reflectance Meter

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[Data] Characteristics of Reflective and Transmissive Light and Color Measurement

We introduce topics such as "the characteristics of reflected and transmitted light from object surfaces" and "methods for measuring color"!

This document introduces the characteristics of reflected and transmitted light and color measurement. It explains topics such as "Characteristics of Reflected and Transmitted Light from Object Surfaces," "Polarization Characteristics," "Methods of Color Measurement," "Angular Spectral Reflectance Coefficient Distribution Curves," and "Examples of Angular Spectral Color Measurement Systems," using diagrams, graphs, and photographs. Please take a moment to read it. 【Contents (Excerpt)】 ■ Characteristics of Reflected and Transmitted Light from Object Surfaces - Spatial Characteristics (Angular Characteristics): Angular Luminance Distribution Curves - Wavelength Characteristics: Spectral Distribution Curves: Color - Polarization Characteristics *For more details, please refer to the PDF document or feel free to contact us.

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Tohoku Univ. Technology:Distributed curvature crystal lens and X-ray reflectance measurement device:T07-098

Realization of a distributed curvature crystal lens with high light focusing accuracy! Able to increase X-ray intensity and realize compact device with long life!

 In a conventional X-ray monochromator, the spectroscopic crystal is elastically bent slightly, then polished to obtain a uniform diffraction. However, this method where the crystal is deformed within the elastic limit, cannot be applied for a large curvature bending, so it can only be used for a big X-ray device. Moreover, there is also an issue on the deformation stability and aging due to keeping the crystal deformed.   This invention is able to realize a distributed curvature crystal lens with a wide incident angle and high light focusing accuracy. This distributed curvature crystal lens is made by plastic deformation of Ge or Si (110) single crystal plate pressed by a mold at high temperature. The X-ray reflectance measurement system of this invention is equipped with above lens which enables to focus a wide angle and significantly increase X-ray intensity.

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